Observation of single event burnout (SEB) in an SOI NLDMOSFET using a pulsed laser
- Resource Type
- Correspondence
- Authors
- Shu, Lei; Qi, Chun-Hua; Galloway, Kenneth F.; Zhao, Yuan-Fu; Cao, Wei-Yi; Li, Xin-Jian; Wang, Liang; Zhang, En-Xia; Wang, Xin-Sheng; Shi, Rui-Xin; Zhou, Xin; Chen, Wei-Ping; Qiao, Ming; Zhou, Bin; Liu, Chao-Ming; Ma, Liang; Zhang, Yan Qing; Wang, Tian-Qi
- Source
- In Microelectronics Reliability January 2021 116
- Subject
- Language
- ISSN
- 0026-2714