Effect of Schottky annealing temperature on reverse leakage current of 6500 V 4H-SiC JBS diodes
- Resource Type
- Article
- Authors
- Niu, Xiping; Wei, Xiaoguang; An, Yunlai; Sang, Ling; Wu, Peifei; Zhou, Yang; Sun, Botao; Zhang, Wenting; Liu, Rui; Du, Zechen; Li, Chenmeng; Shen, Zhanwei; Yang, Tongtong; Luo, Weixia; Tian, Yan; Yang, Fei
- Source
- In Journal of Crystal Growth 15 April 2023 608
- Subject
- Language
- ISSN
- 0022-0248