Effects of constant voltage stress on bipolar degradation in 4H-SiC IGBT
- Resource Type
- Article
- Authors
- An, Yunlai; Zhang, Wenting; Tang, Xinling; Niu, Xiping; Wang, Liang; Yang, Xiaolei; Shen, Zhanwei; Sun, Junmin; Sang, Ling; Liu, Rui; Du, Zechen; Luo, Weixia; Li, Ling; Chen, Zhongyuan; Wei, Xiaoguang; Yang, Fei
- Source
- In Journal of Crystal Growth 1 March 2023 605
- Subject
- Language
- ISSN
- 0022-0248