journal of electronic testing (34)
ieee transactions on computer-aided design of integrated circuits & systems (24)
journal of electronic testing: theory and applications (17)
ieee transactions on computers (12)
zuverlassigkeit mechatronischer systeme (9)
acm transactions on design automation of electronic systems (8)
it - information technology (8)
proceedings of the conference: design, automation & test in europe (7)
2016 ieee 25th asian test symposium (ats) (6)
2016 ieee 25th asian test symposium (ats), asian test symposium (ats), 2016 ieee 25th, asian test symposium, 2016 ieee 25th (6)
dac: annual acm/ieee design automation conference (6)
journal of electronic testing: theory & applications (6)
science china information sciences (6)
journal of electronic testing-theory and applications (5)
ieee transactions on computer-aided design of integrated circuits and systems (4)
2010 19th ieee asian test symposium, test symposium (ats), 2010 19th ieee asian (3)
2011 asian test symposium, test symposium (ats), 2011 20th asian (3)
2011 sixteenth ieee european test symposium, test symposium (ets), 2011 16th ieee european (3)
2012 17th ieee european test symposium (ets), test symposium (ets), 2012 17th ieee european (3)
2014 19th ieee european test symposium (ets), test symposium (ets), 2014 19th ieee european (3)
2020 design, automation & test in europe conference & exhibition (date) (3)
institute of electrical and electronics engineers. transactions on computers (3)
12th ieee european test symposium (ets'07), test symposium, 2007. ets '07. 12th ieee european (2)
2008 13th european test symposium, test symposium, 2008 13th european (2)
2009 14th ieee european test symposium, test symposium, 2009 14th ieee european (2)
2009 design, automation & test in europe conference & exhibition, design, automation & test in europe conference & exhibition, 2009. date '09. (2)
2011 ieee 17th international on-line testing symposium, on-line testing symposium (iolts), 2011 ieee 17th international (2)
2012 ieee 21st asian test symposium, test symposium (ats), 2012 ieee 21st asian (2)
2013 22nd asian test symposium, test symposium (ats), 2013 22nd asian (2)
2013 design, automation & test in europe conference & exhibition (date), design, automation & test in europe conference & exhibition (date), 2013 (2)
2013 ieee international symposium on defect and fault tolerance in vlsi and nanotechnology systems (dfts), defect and fault tolerance in vlsi and nanotechnology systems (dft), 2013 ieee international symposium on (2)
2014 design, automation & test in europe conference & exhibition (date), design, automation and test in europe conference and exhibition (date), 2014 (2)
2014 ieee 23rd asian test symposium, test symposium (ats), 2014 ieee 23rd asian (2)
2014 international test conference, test conference (itc), 2014 ieee international (2)
2015 design, automation & test in europe conference & exhibition (date), design, automation & test in europe conference & exhibition (date), 2015 (2)
2015 ieee 21st international on-line testing symposium (iolts), on-line testing symposium (iolts), 2015 ieee 21st international (2)
2015 ieee 24th asian test symposium (ats), test symposium (ats), 2015 ieee 24th asian (2)
2016 21th ieee european test symposium (ets), test symposium (ets), 2016 21th ieee european (2)
2017 22nd ieee european test symposium (ets), test symposium (ets), 2017 22nd ieee (2)
2017 ieee 35th vlsi test symposium (vts), vlsi test symposium (vts), 2017 ieee 35th (2)
2018 ieee 23rd european test symposium (ets), test symposium (ets), 2018 ieee 23rd european (2)
ieee design & test (2)
ieee embedded systems letters (2)
informacije midem-journal of microelectronics electronic components and materials (2)
international journal of systems science. principles and applications of systems and integration (2)
journal of computer science and technology (2)
microelectronics reliability (2)
science china-information sciences (2)
integration (1)
integration, the vlsi journal (1)