An improved electric field probe with applications in high efficiency PA design and diagnostics
- Resource Type
- Conference
- Authors
- Dehghan, N.; Cripps, S.; Porch, A.; Lees, J.
- Source
- 81st ARFTG Microwave Measurement Conference Microwave Measurement Conference (ARFTG), 2013 81st ARFTG. :1-4 Jun, 2013
- Subject
- Fields, Waves and Electromagnetics
Radiofrequency integrated circuits
Radio frequency
Indexes
Performance evaluation
Conductors
Frequency control
Calibration
High power amplifiers
microwave measurements
microwave imaging
microwave transistors
- Language
An Electric Field Probe is described, which has substantially improved bandwidth and spatial resolution compared to previously reported work [1]. Calibration tests on the reported probe shows a flat amplitude and phase response up to 6GHz. A novel calibration technique is described, which has enabled direct observation of device plane voltages in high power RFPAs. Results show evidence of various anomalous effects, including variation of voltage across the periphery of high power RF devices.