eArticles

1 . Academic Journal

Antioxidant and anti-inflammatory activities of different parts of rhubarb (Rheum rhabarbarum) compared with da huang root (R. officinale)

저자: by Ho-Hyeon Lee; Ju-Kyung Yu; Yong-Sun Moon.
소스: Food Science and Preservation. 2022-04 29(2):186-195

5 . Academic Journal

Antioxidant and anti-inflammatory activities of different parts of rhubarb (Rheum rhabarbarum) compared with da huang root (R. officinale)

저자: by 이호현; 유주경; 문용선.
소스: Food Science and Preservation, 29(2), pp.186-195 Apr, 2022

Open Access (KCI)

5 . Academic Journal

Capacitance Modeling With Charge Partitions Covering Full-Region Operations of TFETs

저자: by Zhang, F.; Dai, W.; Wang, K.; Li, Y.; Peng, B., et al.
소스: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(7):4373-4380 Jul, 2024

7 . eBook

Copy of Letter from Y. H. Huang to Mr. Walker R. Young re: Messrs. H. Y. Hsu and K. H. Yang Appointed to Represent National Hydroelectric Engineering Bureau in Denver, August 24, 1946

저자: by Huang, Y. H., author; Huang, Y. H., author.
소스

4 . eBook

Letter from Y. H. Huang to Walker R. Young, November 7, 1946

저자: by Huang, Y. H., author; Huang, Y. H., author.
소스

4 . Academic Journal

Modeling the Coupled Charge Trapping Dynamics in FeFETs for Reliability Characterizations

저자: by Cai, P.; Li, H.; Ji, Z.; Zhang, L.; Wang, R., et al.
소스: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(9):5779-5783 Sep, 2024

7 . Report

DUNE Phase II: Scientific Opportunities, Detector Concepts, Technological Solutions

저자: by DUNE Collaboration; Abud, A. Abed; Abi, B.; Acciarri, R.; Acero, M. A., et al.
소스

7 . Dissertation/ Thesis

채무 제약과 경영자 과신이 기업 R&D 투자에 미치는 영향 : 중국 상장기업을 중심으로 / The effects of debt constraints and managerial overconfidence on corporate R&D investment - Empirical evidence from China

저자: by 황완산 / Huang, Wan Shan.
소스

Full Text (dCollection)

3 . Academic Journal

Understanding Retention Time Distribution in Buried-Channel-Array-Transistors (BCAT) Under Sub-20-nm DRAM Node—Part I: Defect-Based Statistical Compact Model

저자: by Liu, Y.; Wang, D.; Ren, P.; Li, J.; Qiao, Z., et al.
소스: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(8):4462-4468 Aug, 2024

7 . Academic Journal

Understanding Retention Time Distribution in Buried-Channel-Array-Transistors (BCAT) Under Sub-20-nm DRAM Node—Part II: PBTI Aging and Optimization

저자: by Liu, Y.; Wang, D.; Ren, P.; Li, J.; Qiao, Z., et al.
소스: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(8):4469-4475 Aug, 2024

공지

DAU Library