X-ray computed tomography in Zernike phase contrast mode at 8 keV with 50-nm resolution using Cu rotating anode X-ray source
- Resource Type
- research-article
- Authors
- Tkachuk, Andrei; Duewer, Fred; Cui, Hongtao; Feser, Michael; Wang, Steve; Yun, Wenbing
- Source
- Zeitschrift für Kristallographie - Crystalline Materials. 222(11):650-655
- Subject
- X-ray microscopy
Computed tomography
Fresnel zone plate
SOFC
Fuel cell
Nanotechnology
X-ray Imaging
Crystallography
Inorganic chemistry
Organic chemistry
- Language
- English
- ISSN
- 2196-7105
2194-4946
High-resolution X-ray computed tomography (XCT) enables nondestructive 3D imaging of complex structures, regardless of their state of crystallinity. This work describes a sub-50 nm resolution XCT system operating at 8 keV in absorption and Zernike phase contrast modes based on a commercially available Cu rotating anode laboratory X-ray source. The system utilizes a high efficiency reflective capillary condenser lens and high-resolution Fresnel zone plates with an outermost zone width of 35 nm and 700 nm structure height resulting in a spatial resolution better than 50 nm currently. Imaging a fragment of the solid oxide fuel cells (SOFC) with 50 nm resolution is presented as an application example of the XCT technique in materials science and nanotechnology.